Applied Rigaku Technologies, Inc. offers Bench top and On-Line EDXRF spectrometers for determining the Si coat weight of your product off-line and on-line.
Our bench top solutions include the NEX QC Series EDXRF spectrometers. Unlike older coat weight systems, the NEX QC Series does not require the use of helium or a special sample cup for Si determination. Simply place a sample in the aperture and measure. In addition, our proprietary algorithms and hardware will assist you in solving the long fought issues with your clay coat applications.
For your on-line needs, we offer the NEX LS (Linear Scanner) for full cross and down web profiling of your Si coat weights real time. The flexible platform of the NEX LS can be installed and maintained by the user. And its intuitive software platform allows one to easily maintain their calibrations and product recipes. Reporting has also been made easy. With standardized roll reports, you can easily fulfill your clients reporting requirements.
www.rigakuedxrf.com
PRODUCTS:
NEX LS Process energy dispersive XRF (EDXRF) spectrometer
NEX QC - Energy Dispersive X-ray Fluorescence Analyzer
BROCHURES:
NEX QC Silicone
NEX LS
